Wavelength stabilized diode laser

ABSTRACT

A hybrid external cavity laser and a method for configuring the laser having a stabilized wavelength is disclosed. The laser comprises a semiconductor gain section and a volume Bragg grating, wherein a laser emission from the semiconductor gain section is based on a combination of a reflectivity of a front facet of the semiconductor gain section and a reflectivity of the volume Bragg grating and the reflectivity of the semiconductor gain section and the volume Bragg grating are insufficient by themselves to support the laser emission. The hybrid cavity laser further comprises an etalon that provides further wavelength stability.

CLAIM OF PRIORITY

This application claims, pursuant to 35 USC 120, priority to, and thebenefit of the earlier filing date of, that patent application, entitled“Wavelength Stabilized Diode Laser, filed on Dec. 3, 2013 and affordedSer. No. 14/094,790, which claimed, pursuant to 35 USC 119, priority to,and the benefit of the earlier filing date of, that provisional patentapplication, entitled “Wavelength Stabilized Diode Laser,” filed on Nov.13, 2013 and afforded Ser. No. 61/903,942, the contents of all of whichare incorporated by reference, herein.

FIELD OF THE INVENTION

This invention relates to the field of diode lasers and moreparticularly to a stable single mode operation of semiconductor diodelasers.

BACKGROUND OF THE INVENTION

Relative to other laser designs, diode lasers are more compact androbust, less expensive, electrically more efficient, radiate less wasteheat, and easier to use as they do not require long warm-up times orgreat amounts of power (e.g., kilowatts) to operate. Overall, laserdiodes offer a lower cost alternative for many applications. Untilrecently, however, diode lasers could not be used in products thatrequire extremely high spectral stability and ultra-low wavelength driftdue to strong temperature-dependence of the semiconductor material fromwhich they are made. Single longitudinal mode diode lasers, such asdistributed feedback (DFB) lasers, exhibit a temperature dependence oftheir optical emission wavelength of about 0.07 nm/°C. This temperaturedependence alone makes the use of laser diodes difficult and costly inapplications requiring a high degree of wavelength stability.

The use of volume holographic gratings, also termed VOLUME BRAGG GRATING(VBG), to stabilize the output wavelength of one or more diode lasers isknown in the art as described, for example, in U.S. Pat. No. 7,889,776.VOLUME BRAGG GRATING and VBG are registered Trademarks of PD-LD Inc.,Pennington, N.J.

FIGS. 1A and 1B represent side-view and top view, respectively,schematic illustrations of diode lasers of this type, often termed“hybrid external-cavity lasers” or HELLS in the art. In such lasers, asemiconductor gain section gain section, 110, provides optical gain. Theoptical radiation emitted from the semiconductor material (i.e., chip)diverges both perpendicular to and parallel to the epitaxial layerstructure of the semiconductor gain section. The perpendicular directionis often termed the “fast axis”, as the radiation pattern in thatdirection diverges at greater angles than the divergence in the paralleldirection, often termed the “slow axis”. Optics are used to collect andcollimate the diverging beam. These optics are often termed a “fast axiscorrector” (i.e., FAC), 120, and a “slow axis corrector” (i.e., SAC),130. The FAC, 120, is typically located between the laser chip and theVBG, 140. The SAC, 130, may be located between the FAC 120 and VBG 140,as shown in FIGS. 1A and 1B. Alternatively, the SAC 130 may be locatedon the output side of the VBG (see for example FIGS. 2A and 2B, wherethe SAC 230 is on an output side of the VGB 240). FIGS. 2A and 2Brepresent side and top views, respectively of a HECL wherein the SAC ispositions on the output side of the VRB. As the element of FIGS. 2A and2B are substantially the same as those described with regard to FIGS. 1Aand 1B, a detailed discussion of the elements of FIGS. 2A and 2B neednot be further described.

Returning to FIGS. 1A and 1B, the reflectivity of the coating applied tothe rear facet of the semiconductor gain section, R₁, 111, located at aposition z₁ in FIG. 1, is high; typically 90-98% at the laserwavelength. The reflectivity of the front facet, R₂, 112, is typicallyseveral percent or more. For example, U.S. Pat. No. 7,298,771 teaches aself-seeded HECL where the gain section operates as a laser and wherethe reflectivity of a front facet, R₂, 112, may be in the range of0.5-20% at the laser wavelength.

To a degree, a VBG-stabilized laser, shown in FIG. 1, may operate on asingle longitudinal mode by using the VBG element as a partiallyreflective output coupler. The spectral reflectivity of the VBG elementis substantially narrower than the width of the gain curve of the activemedium of the laser. Only the longitudinal modes of the laser cavitywith sufficient gain to exceed the lasing threshold will oscillate andbe amplified. In some cases, the output of the laser module will consistof a single longitudinal mode.

In the conventional HECL shown in FIG. 1, the front and back surfaces ofthe collection/collimation optics. FAC and SAC, as well as the entranceand exit surfaces of the VBG 140 are anti-reflection coated so that therole of reflections from these surfaces does not contributesignificantly to establishing optical cavities. The reflectivity of thewavelength selective feedback element (i.e., the volume Bragg grating ofFIG. 1) is high relative to the reflectivity of the front facet of thegain chip, and thus a simplified analysis in which the front facet isignored may be applied. In that case the functional optical cavity isestablished between the rear facet of the semiconductor gain section, atposition z₁, and the effective position of the VBG, which is determinedby the length of the VBG, the refractive-index variations of the VBG,and the periodicity of the contained Bragg grating. The optical cavityestablished by these reflections is shown as having a length L₂, 162, inFIG. 1, which defines a Fabry-Perot etalon. The spacing of transmissionand reflection maxima produced by a Fabry-Perot etalon is:

$\begin{matrix}{{\Delta\; v_{C}} = \frac{c}{2\;{OPL}}} & (1)\end{matrix}$

-   -   where c is the speed of light in vacuum;    -   OPL is the optical path length.

OPL is determined by the summation of the physical path length, L_(i),multiplied by the effective refractive-index, η_(i), of each segment ofthe optical path.

In the HECL shown in FIG. 1, the semiconductor gain section having aphysical length of 1.5 mm (millimeter) and a refractive index ofapproximately 3.5 (at a wavelength, λ₀ of 1.064 μm), the effectivelength of the VBG may be approximately 1.5 mm with a refractive-index ofapproximately 1.5; the total thickness of the FAC and SAC may beapproximately 2 mm with a refractive-index of approximately 1.5; and thetotal effective physical length of the Fabry-Perot cavity may beapproximately 10 mm. The OPL is then approximately 15.5 mm, as shown inTable 1.

TABLE 1 L_(i) η_(i)Li (mm) η_(i) (mm) Gain section 1.5 3.5 5.25 FAC +SAC 2.0 1.5 3.00 VBG 1.5 1.5 2.25 Free space 5.0 1.0 5.00 OPL 15.50

The free spectral range of such a cavity, given by Eq. 1, is Δν_(C)approximately 9.7 GHz, or ΔλC approximately 37 pm (picometers) at λ₀=1.064 μm (micrometers).

The principle by which a conventional HECL operates is illustrated inFIG. 3.

As shown in FIG. 3, the semiconductor gain section, 110 (of FIGS. 1A,1B) has a gain profile, 310 that is broad. Typically, the full-width athalf-maximum of the gain profile (i.e., 3 db points) can be 30 nm(nanometers) or greater.

The laser cavity formed by R₁, 111, and the VGB, 140, having a length ofL₂, 162, in FIGS. 1A, 1B supports many modes, indicated by the set ofdiscrete modes 360 of FIG. 3. In conventional practice, the HECL isconfigured so that only one mode, 361, of the set of discrete modes 360,is at a wavelength for which the diode chip gain exceeds a lasingthreshold, 365; such that a lasing output is achieved. The HECL will,preferentially, operate on that cavity mode. That is generate a lasingoutput at wavelength λ₀.

Also shown in FIG. 3 is the spectral reflection profile, 340, of theVBG, 140 (of FIG. 1A). Although the spectral reflection profile, 340, ofthe VBG gain profile is shown as centered with respect to the gainprofile 310, it will be appreciated that the spectral reflectionprofile, 340, of the VBG gain profile does not need to be centered withrespect to the gain profile, 310, of the laser chip. Generally the VBGprofile is often offset with respect to the laser chip profile. Thewidth of the spectral profile of the VBG, Δλ_(VBG), 341, is considerablynarrower than that of the diode laser gain profile, 310, and can bedetermined by the number of Bragg grating planes, N, formed in the VBG:Δλ_(VBG)/λ₀ ≈N  (2)

In a VBG having a length of approximately 3 mm, with Bragg gratingplanes spaced by λ₀,/2n, where n is the refractive-index of thematerial, N may be of the order of 104, at λ₀=1.064 μm. Thus, Δλ_(VBG)is approximately 100 pm.

A Fabry-Perot resonator such as that formed by the R₁, 111, and the VBG140 may be further characterized by peaks in the transmission whichcorrespond to cavity resonances within the etalon, and hence the allowedlasing modes of the cavity. A description of the transmission of lightthrough a Fabry-Perot etalon is schematically depicted in FIG. 4 ascurve 450. The transmission of light, T, can be expressed by:

$\begin{matrix}{T = \frac{\left( {1 - \sqrt{R_{1}R_{2}}} \right)^{2}}{1 + {R_{1}R_{2}} - {2\sqrt{R_{1}R_{2}}{\cos\left( \frac{4\;\pi\;{nL}}{\lambda} \right)}}}} & (3)\end{matrix}$

-   -   where n is the refractive index of the medium        -   L is the path length,        -   λ is the wavelength of light,        -   R₁ is the reflectivity of the rear facet of the resonant            cavity, and        -   R₂, in this case, may represent R_(VBG).

An exemplary HECL operating at λ=1.064 μm, with the laser chip having arear reflectivity R₁ of approximately 0.9 may have a VBG with a lengthof 3 mm and a reflectivity, R_(VBG) approximately equal to 0.3. For thepurposes of this simplified calculation, n=1, and L=15.5 mm. Theresultant Fabry-Perot etalon has a finesse, i.e. a ratio of the freespectral range, Δλ_(C), to the full-width at half-maximum of thespectral distance between resonance, of approximately 4.8.

Referring to FIG. 4, a subset of the set of resonant wavelengths of theFabry-Perot etalon is denoted as 460. The set of cavity resonancesarising from reflections, from R₁ and the VBG now are depicted as havingfinite width, and are shown as the shape 460 in FIG. 4. Superposed onthe cavity resonances 460 is the spectral profile 441 of the emissionreflected from the VBG, which is sufficiently narrow relative to thespacing of the cavity resonances so that only one cavity mode, 461,exceeds the gain threshold for lasing. The HECL will, therefore,oscillate at the wavelength of that cavity mode, λ₀, 470.

Such operation, however, is not stable with respect to minor variationsin operating parameters, such as variations in laser power, thetemperature of the VBG, and thermal expansion of the optical cavity. Inaddition, instabilities often result from laser emission from thesemiconductor gain section acting as a laser on its own. In the priorart disclosed here, HECL systems with VBGs are designed such that thesemiconductor gain section is a laser. For example, in U.S. Pat. No.7,298,771 the use of a laser diode in conjunction with a VBG, such thatthe reflected light from the VBG only causes a narrowing of the emissionspectrum of the laser diode. This design has significant shortcomings,however, as the laser diode is operating without any reflected lightfrom the VBG. The reflectivity from the Bragg grating simply narrows theexisting laser emission. Thus, as the laser diode drive is varied tovary the output of the diode, instabilities may be introduced due tovariations in spatial modes and gain saturation, leading to mode hopsand linewidth broadening. The devices can even operate such thatemission from the lasing of the semiconductor cavity occurssimultaneously with emission from the cavity formed by the VBG. Anexample of this mode of operation may be found in E Kotelnikov et al,Proc. of SPIE Vol. 8277, 2012. Similar effects can occur due totemperature variations.

The basic principles of operation of VBG-stabilized HECLs as describedin the prior art are insufficient to guarantee single-longitudinal modeoperation, in fact, relatively small values of the front-facetreflectivity, R₂ (112 in FIG. 1A), result in resonances in thesemiconductor gain section defined by its own Fabry-Perot cavity,independent of the HECL cavity formed by the VBG element. The value ofR₂ at which such self-oscillation occurs depends on the gain of thesemiconductor gain section (and the value of R₁), and can occur even ata reflectivity of a few percent or less. Furthermore, laser oscillationon multiple modes of the HECL cavity have been observed even when thevalue of R₂ is as low as 0.5% for devices with long gain sections athigh drive current. In such cases, the laser mode hops between allowedmodes oscillating at different wavelengths (i.e., wavelength hopping).

Hence, a hybrid external cavity laser that provides substantiallyincreased stability and reduced linewidth of generated laser light isneeded in the industry.

SUMMARY OF THE INVENTION

Briefly, to achieve the desired objects of the present invention inaccordance with a preferred embodiment, disclosed is a hybrid externalcavity laser with enhanced wavelength stability. The hybrid externalcavity laser utilizes a VBG as a reflector and output coupler, withspecific reflectivity optimized to enhance wavelength stability of thedevice. In conjunction with a semiconductor gain section which also hasspecific reflectivities, multiple cavities are formed within the hybridexternal cavity laser device. Only when the resonances of the multiplecavities are aligned does the device act as a laser, assuring stablesingle mode operation. Wavelength stability is further enhanced byadjusting the reflectance profile of the VBG so that its peaksubstantially coincides with resonance peaks of the multiple cavitiesformed within the device. The resonances are aligned by adjusting theposition of the VBG and/or the temperature of the individual cavities.As the VBG is fabricated in glass, which has a low thermal coefficientof expansion, the properties of the Bragg grating are quite stable withtemperature. In addition, the optical components are mounted on a lowcoefficient of expansion platform, typically formed from silicon orceramic. Thus the external cavity length is stable with temperature,further improving the wavelength stability of the device describedherein. These factors combine to form a hybrid external cavity laserthat operates in a single mode with narrow linewidth and exceptionalwavelength stability, even at high output powers.

The devices and methods disclosed herein differ from prior art relatedto external cavity wavelength stabilized semiconductor lasers in thatthe prior art uses a semiconductor laser and an external cavity thatprovides a wavelength narrowing seed to force the semiconductor laser tooscillate at a specific wavelength; i.e., the semiconductor lasercomponent is injection-locked. The instant invention uses asemiconductor gain section that, through the choice of gain sectionlength and facet reflectivity, cannot lase on its own without thefeedback provided by the VBG. Additionally, the reflectivity of the VBGis chosen such that feedback from the grating is insufficient on its ownto support operation of the HECL device. Thus the HECL device can onlyoperate when the feedback from the front facet of the semiconductor gainsection and the feedback from the VBG resonantly combine to supportlaser operation of the device. This ensures that thewavelength-stabilized laser of this disclosure can oscillate only atwavelengths defined by the coincidence of modes allowed by the externalcavities and the reflection profile of the VBG. Single wavelengthoperation with narrow linewidths and exceptional stability is observed.

The objects and other aspects of the invention are further achieved bychoosing the specific reflectivities of the VBG and facets of thesemiconductor gain section so as to maximize the wavelengthstabilization while minimizing the potential for lasing of thesemiconductor gain section on its own, which would serve to de-stabilizethe device. Additionally, the length and unit gain of the gain sectionmay be adjusted in conjunction with the reflectivities of the gainsection and the VBG to provide maximum device performance.

The objects and other aspects of the invention are further achieved byincorporating a Fabry-Perot etalon within the device to act as a narrowlinewidth filter, to provide additional wavelength stability. The etalonis tilted to prevent non-resonant reflected emission from its surfacesfrom reflecting into the semiconductor gain section and destabilizingthe device.

BRIEF DESCRIPTION OF THE DRAWINGS

For a better understanding of exemplary embodiments and to show how thesame may be carried into effect, reference is made to the accompanyingdrawings. It is stressed that the particulars shown are by way ofexample only and for purposes of illustrative discussion of thepreferred embodiments of the present disclosure, and are presented inthe cause of providing what is believed to be the most useful andreadily understood description of the principles and conceptual aspectsof the invention. In this regard, no attempt is made to show structuraldetails of the invention in more detail than is necessary for afundamental understanding of the invention, the description taken withthe drawings making apparent to those skilled in the art how the severalforms of the invention may be embodied in practice. In the accompanyingdrawings:

FIGS. 1A and 1B illustrate side and top views, respectively, of aconventional hybrid external cavity laser (HECL)

FIGS. 2A and 2B illustrate side and top views, respectively, of anotherembodiment of a conventional HECL.

FIG. 3 illustrates a reflection spectrum due to VBG and Fabry-Perotresonances formed by the rear facet of the semiconductor gain sectionand VBG.

FIG. 4 illustrates an exemplary cavity resonances and threshold gain fora semiconductor gain section.

FIG. 5 illustrates an exemplary superposition of cavity resonances ofsub-cavities formed by the rear reflector-VBG and the semiconductor gainsection.

FIG. 6 illustrates an exemplary superposition of subsets of resonantmodes of a HECL cavity and a semiconductor gain section and reflectionprofile of the VBG element, allowing selection of a single laser mode inaccordance with the principles of the invention.

FIG. 7 illustrates a top view of an exemplary configuration of anembodiment of a HECL in accordance with the principles of the invention

FIG. 8 illustrates an exemplary depiction of widely separatedsemiconductor gain section cavity modes compared to HECL cavity modesand the width of the VBG reflection profile in accordance with theprinciples of the invention.

FIG. 9 illustrates an exemplary depiction of the modes arising when theoptical length of the semiconductor gain section is chosen to beone-half the optical length of the VBG cavity in accordance with theprinciples of the invention.

FIGS. 10A and 10B illustrate an exemplary round trip gain analysis foran HECL device with R₂>0 in accordance with the principles of theinvention.

FIG. 11 illustrates a plot of threshold modal gain vs. VBG reflectivitywith front facet reflectivity R₂ as a parameter in accordance with theprinciples of the invention

FIG. 12 illustrates an exemplary embodiment of a HECL incorporating anetalon element in accordance with the principles of the invention.

FIG. 13 illustrates an exemplary superposition of cavity modes allowedby the VBG cavity, a semiconductor gain section cavity and a discreteetalon.

FIG. 14 illustrates a transmission profiles for a BK7 etalon, 2mm-thick, operating at 1.064 μm in accordance with the principles of theinvention.

It is to be understood that the figures and descriptions of the presentinvention described herein have been simplified to illustrate theelements that are relevant for a clear understanding of the presentinvention, while eliminating, or purposes of clarity only, many otherelements. However, because those eliminated elements are well-known inthe art, and because they do not facilitate a better understanding ofthe present invention, a discussion of such elements or the depiction ofsuch elements is not provided herein. The disclosure herein is directedalso to variations and modifications known to those skilled in the art.

DESCRIPTION OF THE INVENTION

Stable single-longitudinal mode operation of a HECL Laser has beenachieved by utilizing a semiconductor gain section in which lasing isprevented by choosing a combination of low front facet reflectivity andcavity length such that the semiconductor gain is insufficient to offsetthe loss of light through the low reflectivity front facet. That is,without feedback from the VBG, the semiconductor gain section operatesin a non-lasing mode (i.e., superluminescent diode). In addition, thereflectivity of the VBG is chosen such that the HECL laser also will notlase in the absence of some feedback from the front facet of thesemiconductor gain section. Thus, in order for the HECL to operate as alaser, the reflected emission from both the front facet and VBG mustresonantly combine to reach lasing threshold. This leads to stablesingle longitudinal mode operation of the HECL embodied herein.

To achieve the necessary resonance of the reflected emissions, theresonant frequencies of the Fabry-Perot cavities formed by the front andrear facets of the semiconductor gain section and by the rear facet ofthe semiconductor gain section and VBG, must align. Using the exemplaryparameters of Table 1, the free-spectral range of the semiconductor gainsection itself, Δλ_(G) is approximately 104 pm. Thus, the combinedeffect of the semiconductor gain section gain curve and diode laserFabry-Perot cavity may be approximated by cavity resonances of Eq. 4,determined using a semiconductor gain section length, L, of 1.5 mm and arefractive-index of 3.5, with a rear facet reflectivity of 90% and afront facet reflectivity of 0.2%. The laser chip gain curve, 410 (ofFIG. 4) is sufficiently broad compared to the other relevant spectralfeatures that it may be approximated as being of constant magnitude overthe wavelength range of interest, i.e., the width of the spectralprofile of the VBG reflection, Δλ_(VBG), 441 of FIG. 4), which is of theorder of 100 pm in width. The transmission function, T, is approximatelysinusoidal and varies between a maximum of 1.00 as is the case for allFabry-Perot etalons operating on a resonance) and approximately 90%, asshown as curve 580 in FIG. 5.

FIG. 5 shows the cavity resonances of both the VBG cavity, 550, and thesemiconductor gain section, 580, when the semiconductor gain section hassufficient front-facet reflectivity to support resonant modes. Theresonances of the VBG cavity 550 and the semiconductor gain sectioncavity 580 are separated in wavelength by Δλ_(C) and Δλ_(G),respectively. As stated above, for the exemplary case shown in Table 1,Δλ_(C) is approximately 37 pm and Δλ_(G) is approximately 104 pm. Theresonant wavelengths of subsets of the two sets of modes are shown asthe vertical lines in the figure. Resonant wavelengths 5601-5613correspond to the resonance peaks for the VBG cavity, 550. Resonantwavelengths 5901-5905 correspond to the peaks for the semiconductor gainsection cavity, 580.

In this example, the separation between semiconductor gain sectionresonant wavelengths, Δλ_(G), is slightly less than three times that ofthe separation between HECL cavity resonant wavelengths, Δλ_(C); i.e.,104 pm versus (3×37=111 pm). Thus, the only coincidence between the twosets of allowed modes shown in FIG. 5 for which the combinedtransmission functions exceeds the threshold gain of the semiconductorgain section occurs at the wavelength of modes 5607 and 5903,respectively. Therefore, the HECL will oscillate at this wavelength,shown as λ₀, 561.

The gain spectrum of the semiconductor gain section, 410 (of FIG. 4), isbroad on the scale shown in FIG. 5 and may be, therefore, considered tobe constant. Also, note that the coincidence between modes 5607 and 5903at, wavelength 561 in FIG. 5 is arbitrarily chosen for illustrativepurposes. However, many instances of overlap of the transmission curves550 and 580 will occur, some of which may exceed lasing threshold. Forexample, in FIG. 5 modes 5602, 5604, and 5610 are substantiallycoincident with peaks in the transmission curves 580 (peaks 5901, 5902,and 5904, respectively) and may be seen to be close to threshold gain aswell. This. These substantially close coincidence could potentiallyexceed threshold under some operating conditions; leading to wavelengthinstabilities in the operation of the device.

A particular coincidence (i.e., mode) may be selected by tuning a centerwavelength of the reflection profile of the VBG element, as shown inFIG. 6, which shows only the center wavelengths of the peaks of theallowed modes. In this exemplary example, the dashed vertical lines,627, represent the center wavelengths of the resonant modes of thecavity forced by the VBG and rear facet of the semiconductor gainsection while the dotted vertical lines 625 represent the centerwavelengths of the resonant modes of the cavity formed by the front andrear facet of the semiconductor gain section.

FIG. 6 shows the VBG reflection profile, 640, superimposed on two setsof resonant cavity wavelengths, 5601-5613 and, 5901-5905, correspondingto the HECL and diode laser cavity modes, respectively, shown in FIG. 5.

In FIG. 6, the reflection profile of the VBG element, however, is showntuned such that the substantially coincident modes at wavelength 5602,5604, and 5610 of FIG. 5 are not reflected sufficiently by the VBG toexceed lasing threshold. The nearly substantially coincident modes at5607 is sufficiently reflected such that the laser will oscillate onlyat λ₀, 661 (which is comparable to wavelength 561 of FIG. 5).

The resultant overlap of the resonant modes of the gain section and VBGsub-cavities and the reflection profile of the VBG leads to strongdiscrimination in favor of the mode 5607 (operating at wavelength at561), as shown in FIG. 5, and allows stable operation of the HECL deviceover a wide range of operating conditions.

In one aspect of the invention, tuning of the center wavelength of theVBG reflection profile may be achieved, for example, by varying thetemperature of the VBG. Typically in an HECL device, the entire cavityis mounted in a stable, temperature controlled package, enabling bothstable operation and the ability to vary the temperature of thecomponents of the HECL device, VBGs are often fabricated by creatingparallel planes of higher and lower refractive index in a photosensitiveoptical material, such as a glass. BK7 is a representative glass hostused to fabricate VBG elements. The coefficient of thermal expansion ofBK7 is approximately 7×10⁻⁶°/C. and the index-of-refraction, η, isapproximately 1.5. Thus, for example, at λ₀=1.064 μm, Bragg gratingplanes are separated by λ₀/2η, or approximately 355 nm. The change ofwavelength within the VBG as a function of temperature is approximately2.5 pm/° C.; in air, this is 7.5 pm/° C. Thus, varying the temperatureof the VBG by a few degrees can easily move the center of its reflectionprofile substantially more than the separation between HECL cavitymodes.

Tuning of the free spectral range of the HECL may also be achieved bypositioning the VBG with respect to the rear-facet reflector of thesemiconductor gain section. Changing the length of this cavity, shown asL₂ (162 of FIG. 1A) alters Δν_(C) as described by Eq. 1.

Referring to Table 1, the free-spectral range of cavity of a HECLconfigured in such a fashion is Δν_(C) approximately 9.7 GHz, or Δλ_(C)approximately 37 pm at λ₀=1.064 μm. Decreasing the path length betweenthe optical components from 5.00 mm to 4.00 mm, for example, changes thetotal optical path length (OPL) to 14.50 mm and, commensurately, thefree spectral range of the HECL cavity to Δν_(C) approximately 10.3 GHz,or Δλ_(C) approximately 39 pm, forming a different comb of allowedcavity modes that will have different coincidences with the allowedcavity modes of the semiconductor gain section.

In practice, it is important to reduce reflections from the front andrear surfaces of the VBG element back into the semiconductor gainsection to levels as low as possible to avoid creating yet additionalFabry-Perot cavities. As schematically illustrated in FIG. 7, the VBGelement, 740, is tilted to skew front-facet reflections, 751, andrear-facet reflections, 752, from the front facet are shown in thefigure for purposes of clarity, thereby substantially reducing theamount of light fed back into the semiconductor gain section, inaddition, the reflectivity of the front and rear surfaces of the VBGelement, R₃, 741, and R₄, 742, have anti-reflection coatings applied toreduce reflections even further. The output laser beam, 750, of the HECLis shown as being emitted to the right of the VBG element, 740. In orderto maximize feedback from the VBG grating, 742, back into the waveguideof the semiconductor gain section, the grating, 742, is preferablyoriented substantially perpendicular to the optical beam, 741, passingthrough it. If the grating is tilted with respect to the optical beam,741, the reflection would follow a different path through thecollimating optics and not be incident on the waveguide of thesemiconductor gain section, 710. As a result, this portion of thereflected light would not contribute to stabilizing the laser. AlthoughFIG. 7 illustrates the VBG element 740 are positioned tilted with regardto the gain material 710, it would be recognized that the VBG may bein-line with the optical output of the gain material 710 and the facetsof the VBG 740 may be tilted or oriented at an angle to the opticaloutput of the gain material.

In another embodiment of the invention, the semiconductor gain sectionlength, L1, 761, is reduced to increase the separation betweenFabry-Perot modes allowed by that cavity, thereby increasing theinherent stability of the laser output wavelength. This configuration ispossible because, for many applications, the HECL laser is used to seeda more powerful optical amplifier or laser, e.g., a fiber laser, whichprovides more than sufficient amplification to produce the optical powerrequired.

For constant reflectivities R₁, R₂, and R_(VBG), it is necessary for thesemiconductor gain chip to produce more gain as its length is reduced.Techniques for increasing the gain are well known in the art and, for acommonly used quantum well gain section, include increasing the numberof quantum wells in quantum well (QW) devices, epitaxially growing QWlayers with built-in compressive or tensile strain, and epitaxiallygrowing layer structures which have increased optical confinement.

Using these techniques, cavity lengths of 1 mm, 500 μm, or even shorterhave often been used to fabricate diode lasers. Table 2 shows anexemplary configuration in which the semiconductor gain section is 500μm and the total HECL cavity length is 12 mm. The SAC element, 730, inthis case is positioned on the input side of the VBG element, 740.

TABLE 2 L_(i) η_(i)L_(i) (mm) η_(i) (mm) Semiconductor 0.5 3.5 1.75 gainsection FAC 1.0 1.5 1.50 VBG 1.5 1.5 2.25 Free space 6.0 1.0 7.50 OPL12.00

The free-spectral range of such a 500 μm-long semiconductor gain sectioncavity is Δν_(G) approximately 85.7 GHz or Δλ_(G) approximately 323 pmat λ₀=1.064 μm. The OPL of the entire HECL cavity of 12.00 mm yields afree-spectral range of Δν_(C) approximately 12.5 GHz or Δλ_(G)approximately 47 pm. Thus, a coincidence between the resonances of thetwo cavities (i.e., semiconductor gain material cavity and VBG cavity)occurs approximately every seventh diode laser mode. This set of modesis schematically illustrated in FIG. 8.

In the exemplary laser of FIG. 7, coincidences between allowedFabry-Perot modes of the semiconductor gain section, 890, shown asdotted thin vertical lines superimposed on allowed HECL cavity modes,860, shown as dashed vertical lines, occur at wavelengths labeled 8001,8002, 8003, and 8004, with only the mode operating at wavelength 8003occurring within the reflection profile, 840, of the VBG element. Thus,only that mode, at wavelength 861 will oscillate independent of thevalue of the reflectivity of the front-facet of the semiconductor gainsection, R₂. This condition applies even when the laser is operatingwell above the threshold gain.

In yet another embodiment of the invention the optical length of thesemiconductor gain section is chosen to be one-half (½) the opticallength of the VBG cavity. As shown in AG. 9, this places the wavelengthsof the minima of the resonant reflectances of the Fabry-Perot cavityformed by the semiconductor gain section (e.g., 9604, 9606, 9608) atwavelengths where alternate resonances of the VBG cavity occur. For anarrow linewidth spectral profile of the VBG, 940, this combination ofthe VBG reflectance profile, 940, the transmission spectrum of thesemiconductor gain section cavity, 980, and the transmission spectrum ofthe VBG cavity, leads to reduced reflectance for modes other than peaklasing mode at wavelength 961 and enhances wavelength stability.

In order to optimize the wavelength stability of the optical emission,it is important to optimize the reflectivities R₂ and R_(VBG) so thatboth resonant cavities participate in the mode selection process, whilesuppressing laser action within the semiconductor resonator. Forsubstantially coincident modes selected by the overlap of the sub-cavityresonances and the VBG gain profile, a simple round-trip gain analysismay be used to determine the desired reflectivities.

In a preferred embodiment of the invention with a finite reflectivity ofthe front facet of the gain section R₂, the reflection R₂ must beincluded in the round trip intensity calculation. When the resonantpeaks of the two cavities are substantially coincident, the reflectedfields can sum. Thus, leading to lasing with optimum mode selectivityand stability. The propagating intensity for finite front facetreflectivity, R₂, is schematically depicted in FIGS. 10A and 10B. FIG.10A is a side view of an HECL, similar to that shown in FIG. 1A. FIG.10B illustrates an exemplary light intensity showing an increase inintensity of the initial nom-lasing light emission 1080 of thesemiconductor gain material. The output of the non-lasing light emission1085 to the VBG 1040 and the reflected light 1090 from the VBG back tothe gain material. Also shown is the reflected light 1090 is amplifiedin the gain material (1092) and the reflected light 1094 of the initiallight 1080. The combination of the reflected light 1092 and 1094contribute to cause a lasing output at a desired wavelength.

By summing up the fields, the threshold modal gain can be calculated tobeGth=−(½L _(g))·ln(R ₂+(1−R ₂)² ·R _(VBG))

This calculation can be applied advantageously to determine the optimumreflectivities for stable operation of the HECL. A particularlyillustrative example is shown in FIG. 11 where the threshold gain isplotted vs. the reflectivity R_(VBG) of the VBG, using the front facetreflectivity R₂ as a parameter. The nominal length of the semiconductorgain section is taken to be 0.5 mm for this exemplary example (in orderto prevent lasing), but may have different values as determined by thedesirable operating parameters of the device. A desirable operatingregion is depicted as a shaded region shown in FIG. 11.

Thus in an embodiment of the invention, the semiconductor gain sectionmay have front facet reflectivity R₂>0.5%, while preventing lasing ofthe gain section without additional feedback from the VBG. Non-lasinggains section may be achieved by decreasing the length of thesemiconductor gain section, as shown in the analysis of the round tripgain of the device, previously presented. In another aspect of theinvention altering the epitaxial layer structure of the semiconductorgain section may be used to prevent lasing of the gain section.

Additionally, as the front facet reflectivity increases, the effect ofthe feedback from the VBG is reduced as more of the grating feedback isreflected by the front facet. In conjunction with the fact that thesemiconductor gain section is more likely to lase on its own at higherfront facet reflectivity, it is thus desirable to limit the value of R₂preferably to a value <5%.

Also from the plots of FIG. 11, it may be seen that the effect ofR_(VBG) on the modal gain increases for R_(VBG)<0.30%. This effect,however, comes at the cost of higher modal gain but also results in morecoupled output power. As the VBG reflectivity is well defined, this is adesirable attribute as the narrow linewidth operation of the HECL deviceshould be predominantly controlled by feedback from the VBG which has anarrow spectral linewidth. Specifically, as the reflectivity from thegrating is decreased for wavelengths different from its peak wavelength,the required modal gain increases rapidly and, thus, emissions not atthe peak wavelength are strongly suppressed. This leads to enhancedwavelength stability of the HECL device.

Thus, as schematically depicted by the shaded region in FIG. 11, adesirable operating regime for stable single wavelength operation may bedefined as R_(VBG)=5-30% and R₂=0.05-5%. Within this region of stablewavelength operation the designer may choose appropriate combinations ofVBG reflectivity and front facet reflectivity (at a desired gain sectionlength) to yield higher powers or lower threshold currents. For example,the coupled output power of the device increases as the reflectivity ofthe VBG decreases, leading to higher output power even as the effect ofthe Bragg grating on wavelength stability increases. But, this operatingregime does require more gain from the semiconductor gain section and,hence, leads to a higher threshold current. As seen in FIG. 11, for again section length of 0.5 mm and reflectivities R₂ approximately 0.5%and R_(VBG) approximately 5%, the required threshold modal gains canapproach 30 cm⁻¹. As this can correspond to QW gains of the order of3000 cm⁻¹, careful design of the QW structure of the semiconductor gainsection is required for proper operation of the device. Thus inaccordance with the principles of the invention, the reflectivity of thefront facet may be chosen in conjunction with the length of thesemiconductor gain chip and the reflectivity of the VBG, to achievedesired performance parameters from the device, e.g., stable single modedevice with high output power.

Alternatively, the VBG reflectivity and front facet reflectivity may bechosen to have higher values for reduced threshold current. For example,for reflectivities R₂ approximately 10% and R_(VBG) approximately 20%,the required modal gain at threshold is only 12 cm⁻¹; a substantialreduction from the high power output embodiment. A device such as thiswould have substantially reduced threshold current but would notnecessarily exhibit good wavelength stability at high output powers.However, in some applications, such as operation as a seed laser for anoptical amplifier where only low power is required, lower lasingthreshold may be a desirable attribute.

In another embodiment of the invention, the expression for thresholdgain in a device with shorter lengths of the semiconductor gainstructure, the required gain can increase rapidly. Thus, shorter devicesrequire more reflectivity from the front facet and the VBG. Increasedfront facet reflectivity increases the gain section finesses, which aidsin mode selection and leads to narrower linewidth operation of the HECLdevice, but at lower powers.

In yet another alternative embodiment of the invention, for higher poweroperation of the HECL device, it is desirable to increase the length ofthe semiconductor gain section to minimize thermal effects. For example,maximum optical power increases of almost 2× (i.e., double) have beenobserved for cavity length increases from 2 mm to 3 mm in externalcavity devices, (see, e.g., E. Kotelnikov et al, Proc. of SPIE Vol.8277, 2012). For those longer cavity lengths, the front facetreflectivity would preferentially be reduced to prevent lasing of thegain section without feedback from the VBG. A threshold gain analysissimilar to that used to generate FIG. 11, but with a cavity length of 3mm, suggests that using front facet reflectivities in the range of0<R₂<0.5% would have minimal effect on the threshold gain of the HECLdevice. Thus, lasing of the gain section may still be suppressed and thewavelength stabilization benefits of the multi-cavity approach may stillbe maintained, even for the long gain section lengths indicated for highpower operation.

The overall modal gain of the semiconductor gain section may also becontrolled by reducing the reflectivity of the rear facet of thesemiconductor gain section. This also reduces the overall gain of theHECL cavity and may be used in conjunction with increased reflectivityof the VBG to achieve narrow linewidth operation. Alternatively, asecond VBG (not shown) may be utilized at the rear of the semiconductorgain section to provide additional linewidth selectivity.

Thus, in accordance with the principles of the invention a method fordesigning HECL devices with different but desirable operating attributeswhile still maintaining good wavelength stability has been disclosed.

Experimental results confirm that lasers conforming to the aboveconfiguration principles will emit laser light in a stable,single-longitudinal mode when the key components of the HECL (see e.g.,FIG. 7), the semiconductor gain section, 710, and the VBG element, 740,are controlled at a temperature that allows the VBG reflection profileto coincide with a desired one of the allowed cavity modes. Thecontrolling temperature is maintained in a stable environment forlong-term stable operation of the HECL.

An exemplary application of wavelength-stabilized laser presented hereinis coherent laser radar (“LIDAR”), in which short pulses of light arereflected by distant objects. The reflected signals are coherentlydetected using a local oscillator in a heterodyne receiver. The pulsesmust be short in duration (e.g., 2 ns pulse widths are common) allowingaxial resolution of approximately 0.6 m. The stability of the wavelengthof the emitted pulse of light must be of the order of 10⁻⁹ to achievethe required level of coherence.

FIG. 12 is a schematic depiction of another embodiment of a HECLincorporating a discrete etalon element. Only a side view of the deviceis shown in FIG. 12. Also, the slow-axis corrector (SAC) is not shown inthis figure (and may be assumed to be on the output side of the VBGelement, 1240). The etalon 1250 is tilted slightly with respect to thecollimated optical emission (not seen in this side view) to preventreflections (1223, 1224) from the etalon surface from being reflectedback into the active region of the semiconductor gain section 1210. Thetilt of the etalon 1250 is sufficiently small that the optical paththrough the tilted etalon is substantially the same as if the etalon wasoriented perpendicular to the collimated optical emission.

The etalon 1250 acts as a transmission filter for the reflected portionof the light from the VBG 1240. As the etalon 1250 presents sharptransmission peaks due to the Fabry-Perot resonances, the etalon 1250acts as a narrow line filter and overlap of its resonances with theother resonances in the HECL cavity further improves wavelengthselection and stability of the device.

The thickness, L_(E), 1261, and refractive index of the discrete etalon1250 may be selected to provide free-spectral range that isincommensurate with the free-spectral range of the HECL cavity. Thecharacteristics of the discrete etalon 1250 may also be chosen to beincommensurate with the free spectral range of the semiconductor gainsection, 1210, if the front-facet reflectivity, R₂, 1212, issufficiently high to create a semiconductor gain section cavity thatcould act as a selection mechanism for allowed lasing modes.

Table 3 shows the free spectral range of an exemplary discrete etaloncomprised of BK7 glass. Any other substantially transparent opticalmaterial would work, as well, as well as Fabry-Perot cavities comprisedof two reflective surfaces separated by a distance, e.g., in air orvacuum.

TABLE 3 L_(E) Δλ_(E) Δν_(E) (mm) (pm) (GHz) 0.5 754 200 1.0 277 100 2.0189 50 3.0 126 33

Selecting, for example, an etalon thickness of 2.0 mm, the allowed modesof a HECL that comprises a subset of cavity modes, 1320, separated inwavelength by 189 pm as shown in FIG. 13.

FIG. 13 illustrates the superposition of the resonant cavity modesallowed by the VBG 1240 and gain sections 1210 as well as thetransmission function of the discrete etalon 1250. Discrete etalon modesare shown at wavelengths 1321, 1322, 1323, 1324, and 1325 as solidvertical lines. The subsets of allowed HECL cavity modes, 1360 are shownas dashed vertical lines, and semiconductor gain section modes, 1390,are shown as dotted vertical lines, as is the reflection profile of theVBG element, 1340. FIG. 13 illustrates the case where only discreteetalon mode 1324 sufficiently coincides with one of the HECL cavitymodes, 1360 and semiconductor gain section modes, 1390, while also beingallowed by the reflection profile of the VBG, 1340. Thus, laseroscillation can only occur at the mode 1361, i.e., at wavelength 1324.

The wavelengths of the subsets of allowed cavity modes, 1320, 1360,and/or 1390, and/or the position of the reflection profile of the VBGelement, 1340, may be shifted individually or in groups by temperaturetuning. Thus, the selection of a desired lasing wavelength may be basedon a temperature of operation of one or more of the disclosed elements.

The reflectivity of the coatings applied to the front- and rear-surfacesof the discrete etalon, R₃ and R₄, respectively (1223 and 1224,respectively, of FIG. 12) may be selected to optimize wavelengthstability and output power.

FIG. 14 shows the transmission profile of an exemplary 2 mm-thick etalonmade of BK7 glass operating at 1.064 μm. Four exemplary transmissioncurves are shown: 1401 is the transmission profile for R₃=R₄=4%; 1402 isthe transmission profile for R₃=R₄=25%; 1403 is the transmission profilefor R₃=R₄=50%; and 1404 is the transmission profile for R₃=R₄=90%. Thefree spectral range ΔλE=189 pm in all cases, determined by the thicknessof the discrete etalon, the refractive index of BK7 glass, and thewavelength of light.

Although FIG. 14 represents transmission profiles that are equal, itwould be recognized that R₃ and R₄ do not have to be the same value. Theeffective reflectivity of a Fabry-Perot etalon is a function of(R₃R₄)^(1/2).

The reflection-limited finesses of above cavities are: 0.9, 2.1, 4.4,and 29.8, for profiles 1401, 1402, 1403, and 1404, respectively. Inpractice, roughness of the reflective surfaces and inaccuracies inparallelism of those surfaces will reduce the peak transmission from100%, with greater effects for high-finesse cavities. In particularly,the peak transmissions for the above cases are approximately 99.95%,99.7%, 98.7%, and 68.0%, respectively. The tradeoff between transmissionloss and wavelength selectivity due to relatively narrow pass bandsimparted by high-reflectivity discrete etalons and high transmissionwith relatively poorer wavelength selectivity imparted bylow-reflectivity discrete etalons suggests that coating having areflectivity in the range of 10 to 75% may be most appropriate for HECLconfigurations incorporating a discrete etalon

As previously described tuning of the center wavelength of the VBGreflection profile may be achieved, for example, by varying itstemperature. Tuning of the coincidences between allowed HECL cavitymodes, allowed discrete etalon modes, and the reflection profile of theVBG element may be accomplished by selecting the temperature at whichthe VBG and/or semiconductor gain section operate. Also, tuning of theHECL cavity modes may be accomplished by changing the position of theVBG element with respect to the rear-facet reflector of the diode lasergain chip, as described earlier with respect to the embodiments of theinvention that do not incorporate a discrete etalon.

Thus, in accordance with the principles of the invention, the laserradiation is only emitted when a sum of the reflected portion of thecollected and collimated plurality of known emission wavelengths fromthe VBG and the portion of the collected and collimated plurality ofknown emission wavelengths reflected by the front facet providessufficient feedback to support laser emission. In addition, reflectedportion from the VBG is insufficient for the device to emit laserradiation without reflection from the front facet. Similarly, thereflected emission from the front facet is insufficient for the deviceto emit laser radiation without the reflected portion from the VBG.Furthermore, the length of the semiconductor gain section is chosen toprovide sufficient gain to support laser emission while providingresonant modes with different spacing than the resonant modes of theresonant cavity formed by the rear reflector and VBG.

As used herein, the terms “comprises” “comprising”, “includes”,“including”, “has”, “having”, or any other variation thereof, areintended to cover non-exclusive inclusions. For example, a process,method, article or apparatus that comprises a list of elements is notnecessarily limited to only those elements but may include otherelements not expressly listed or inherent to such process, method,article, or apparatus. In addition, unless expressly stated to thecontrary, the term “of’ refers to an inclusive “or” and not to anexclusive “or”. For example, a condition A or B is satisfied by any oneof the following: A is true (or present) and B is false (or notpresent); A is false (or not present) and B is true (or present); andboth A and B are true (or present).

The terms “a” or “an” as used herein are to describe elements andcomponents of the invention. This is done for convenience to the readerand to provide a general sense of the invention. The use of these termsin the description herein should be read and understood to include oneor at least one. In addition, the singular also includes the pluralunless indicated to the contrary. For example, reference to acomposition containing “a compound” includes one or more compounds. Asused in this specification and the appended claims, the term “or” isgenerally employed in its sense including “and/or” unless the contentclearly dictates otherwise.

All numeric values are herein assumed to be modified by the term“about,” whether or not explicitly indicated. The term “about” generallyrefers to a range of numbers that one of skill in the art would considerequivalent to the recited value (i.e., having the same function orresult). In any instances, the terms “about” may include numbers thatare rounded (or lowered) to the nearest significant figure.

The invention has been described with reference to specific embodiments.One of ordinary skill in the art, however, appreciates that variousmodifications and changes can be made without departing from the scopeof the invention as set forth in the claims. Accordingly, thespecification is to be regarded in an illustrative manner, rather thanwith a restrictive view, and all such modifications are intended to beincluded within the scope of the invention.

Benefits, other advantages, and solutions to problems have beendescribed above with regard to specific embodiments. The benefits,advantages, and solutions to problems, and any element(s) that may causeany benefits, advantages, or solutions to occur or become morepronounced, are not to be construed as a critical, required, or anessential feature or element of any or all of the claims.

It is expressly intended that all combinations of those elements thatperform substantially the same function in substantially the same way toachieve the same results are within the scope of the invention.Substitutions of elements from one described embodiment to another arealso fully intended and contemplated.

What is claimed is:
 1. A device for generating a laser emission having asingle stable wavelength, the device comprising: a semiconductor gainsection having a light emission of a known gain spectrum, saidsemiconductor gain section comprising: a rear facet having a firstreflectivity; and a front facet having a second reflectivity, said rearfacet and said front facet forming a first resonant cavity having afirst plurality of resonances within the gain spectrum of saidsemiconductor gain section, wherein at least one or said first andsecond reflectivity is selected to cause each of sad first plurality ofresonances to have insufficient modal gain to achieve a lasingthreshold; and a volume Bragg grating, having a known reflectivity,wherein the rear facet of the semiconductor gain section and the volumeBragg grating form a second resonant cavity, partially overlapping thesemiconductor gain section, said second resonant cavity having a secondplurality of resonances within said gain spectrum, wherein areflectivity of said volume Bragg grating is selected to cause each ofsaid second plurality of resonances to have insufficient modal gain toachieve a threshold, wherein one of said first plurality of resonancesand one of said second plurality of resonances are substantiallycoincident within the gain section at a single wavelength, and saidfront facet reflectivity and said VBG reflectivity are further selectedsuch that the modal gain at the substantially coincident resonance issufficient to achieve a lasing threshold only at said substantiallycoincident resonance and generate said laser emission having exceptionalwavelength stability at the single wavelength.
 2. The device of claim 1,wherein the rear facet reflectivity is fixed and the front facetreflectivity is chosen such that the modal gain of the first pluralityof resonances is less than said lasing threshold.
 3. The device of claim1, wherein the reflectivity of the front facet is fixed and thereflectivity of the volume Bragg grating is selected such that the modalgain at the substantially coincident resonance is greater than thelasing threshold.
 4. The device of claim 1, wherein a reflected portionof the light emission-from the volume Bragg grating is less than 30% atsaid laser emission.
 5. The device of claim 1, wherein the reflectivityof the front facet is in a range from 0.1-10.0% at said laser emission.6. The device of claim 1, wherein the reflectivity of the rear facet isselected such that the modal gain of the first plurality of resonancesis less than the lasing threshold.
 7. The device of claim 1, wherein therear facet has a reflectivity of at least 80% of said wavelength.
 8. Thedevice of claim 1, wherein the rear facet is coated with a lowreflectivity coating.
 9. The device of claim 8, further comprising: asecond volume Bragg grating in optical communication with said rearfacet.
 10. The device of claim 1, wherein a length of the semiconductorgain section is selected based on said second reflectivity.
 11. Thedevice of claim 10, wherein the length of the semiconductor gain sectionis in a range of 0.2-2.0 mm (millimeters).
 12. The device of claim 1further comprising: a discrete etalon element positioned between saidfront facet of said semiconductor gain section and said volume Bragggrating, said etalon element comprising: a front optical surface; and arear optical surface, each of said front and rear optical surfacescoated with partially reflective coatings, said reflective coatingsdetermining allowed resonances of the discrete etalon, wherein one ofsaid allowed resonances is substantially coincident with saidsubstantially coincident one of said plurality of first resonances andsaid plurality of second resonances.
 13. The device of claim 12, whereinthe etalon is tilted with respect to the laser emission.
 14. The deviceof claim 12, wherein the etalon is tilted with respect to the laseremission at an angle of 0.5-5.0 degrees.
 15. The device of claim 1,wherein a wavelength of the laser emission is between about 375 nm andabout 3000 nm.
 16. The device of claim 12, wherein the front and rearoptical surfaces of the discrete etalon are each coated to reflectbetween approximately 10% and 99% said laser emission.
 17. The device ofclaim 1, further comprising: an optics section collecting andcollimating said light emission into said volume Bragg grating. 18.device for generating a laser emission having a stable wavelength, thedevice comprising: a semiconductor gain section having a light emissionof a known gain spectrum, said semiconductor gain section comprising: again region having a known length; a rear facet having a firstreflectivity; and a front facet having a second reflectivity, said gainregion, rear facet and front facet forming a first resonant cavityhaving a first plurality of resonances within the gain spectrum of saidsemiconductor gain section, wherein said first reflectivity, said secondreflectivity and the length of said gain region are selected to causeeach of said first resonances to have a modal gain less than a lasingthreshold of said gain section; and a volume Bragg grating (VBG), havinga known reflectivity, wherein the rear facet of the semiconductor gainsection and the volume Bragg grating form a second resonant cavitypartially overlapping the semiconductor gain section, said secondresonant cavity having a second plurality of resonances within said gainspectrum, wherein said reflectivity of said volume Bragg grating beingselected to cause each of the second plurality of resonances to haveinsufficient modal gain to achieve said lasing threshold of said gainsection, wherein one of said first plurality of resonances and one ofsaid second plurality of resonances are substantially coincident withinthe gain section at a single wavelength, and said front facetreflectivity and said VBG reflectivity are further selected such that amodal gain at the substantially coincident resonance is greater thansaid lasing threshold for generating an exceptional stable laseremission at said single wavelength.
 19. The device of claim 18, whereinthe reflectivity of the volume Bragg grating is fixed and the length ofthe gain region is selected such that the modal gain at the coincidentresonance is greater than the lasing threshold.
 20. The device of claim18, wherein the length of the gain region is fixed and a unit gain ofthe gain section is selected such that the modal gain at the coincidentresonance is greater than the lasing threshold.
 21. The device of claim20, wherein a unit gain of the semiconductor gain section is increasedby at least one of: increasing a modal confinement factor, increasing anumber of quantum wells and employing quantum wells with one of tensilestrain and compressive strain.
 22. The device of claim 18, wherein thelength of the semiconductor gain section is in the range of 0.2-2.0 mm(millimeters).
 23. The device of claim 18, wherein said volume Bragggrating receives said light emission from said front facet of said gainsection.
 24. The device of claim 18, wherein said volume Bragg gratingreceives said light emission from said rear facet of said gain section.25. The device of claim 18, further comprising: an optics sectionpositioned between said gain section and said volume Bragg grating, saidoptics section receiving and collimating said light emission.
 26. Thedevice of claim 18, further comprising: an etalon positioned betweensaid gain section and said volume Bragg grating.
 27. The device of claim26, wherein said etalon forming a cavity having a plurality of thirdresonances, one of said third resonances being substantially coincidencewith said coincident resonance.
 28. The device of claim 18, wherein saidcoincident resonance is determined based on at least one of: a positionof the VBG with respect to the gain section and a temperature of one of:the first resonance cavity and the second resonance cavity.
 29. Thedevice of claim 18, wherein tuning a center wavelength of the reflectedportion of the light emission from the volume Bragg grating is achievedby varying a temperature of the volume Bragg grating.